Analysis of periodic solutions in tapping-mode AFM: An IQC approach
نویسندگان
چکیده
The feedback perspective with the cantilever viewed as a linear system and the tip-sample interaction appearing as a nonlinear feedback is useful in analyzing AFM (Atomic Force Microscope) dynamics. Conditions for the existence and stability of periodic solutions for such a system when forced sinusoidally are obtained. These results are applied to the case where the AFM is operated in the tapping-mode. The near sinusoidal nature of periodic solutions is established by obtaining bounds on the higher harmonics. The concept of Integral Quadratic Constraints (IQC) is widely used in the analysis.
منابع مشابه
Fourier transformed atomic force microscopy: tapping mode atomic force microscopy beyond the Hookian approximation
The periodic impact force induced by the tip–sample contact in tapping mode atomic force microscopy (TM-AFM) gives rise to anharmonic oscillations of the sensing cantilever. These anharmonic signals can be understood with a model which goes beyond the common Hookian approximation: the cantilever is described as a multiple degree of freedom system. A theoretical analysis of the anharmonic signal...
متن کاملMaterial property analytical relations for the case of an AFM probe tapping a viscoelastic surface containing multiple characteristic times
We explore the contact problem of a flat-end indenter penetrating intermittently a generalized viscoelastic surface, containing multiple characteristic times. This problem is especially relevant for nanoprobing of viscoelastic surfaces with the highly popular tapping-mode AFM imaging technique. By focusing on the material perspective and employing a rigorous rheological approach, we deliver ana...
متن کاملFrequency and force modulation atomic force microscopy: low-impact tapping-mode imaging without bistability
Since the 1980s, atomic force microscopy (AFM) has rapidly developed into a versatile, high-resolution characterization technique, available in a variety of imaging modes. Within intermittent-contact tapping-mode, imaging bistability and sample mechanical damage continue to be two of the most important challenges faced daily by AFM users. Recently, a new double-control-loop tapping-mode imaging...
متن کاملTapping mode atomic force microscopy in liquid
We show that standard silicon nitride cantilevers can be used for tapping mode atomic force microscopy (AFM) in air, provided that the energy of the oscillating cantilever is sufficiently high to overcome the adhesion of the water layer. The same cantilevers are successfully used for tapping mode AFhif in liquid. Acoustic modes in the liquid excite the canti1eve.r. On soft samples, e.g., biolog...
متن کاملProbing small unilamellar EggPC vesicles on mica surface by atomic force microscopy.
Sonicated small unilamellar egg yolk phosphatidylcholine (EggPC) vesicles were investigated using atomic force microscopy (AFM) imaging and force measurements. Three different topographies (convex, planar, and concave shape) of the EggPC vesicles on the mica surface were observed by tapping mode in fluid, respectively. It was found that the topography change of the vesicles could be attributed ...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
عنوان ژورنال:
دوره شماره
صفحات -
تاریخ انتشار 2002